Publication in Critical Reviews in Solid State and Materials Science


Lapresta-Fernandez, A.; Salinas-Castillo, A.; de la Llana, S. A.; Costa-Fernandez, J. M.; Dominguez-Meister, S.; Cecchini, R.; Capitan-Vallvey, L. F.; Moreno-Bondi, M. C.; Marco, M. P.; Sanchez-Lopez, J. C.; Anderson, I. S., A General Perspective of the Characterization and Quantification of Nanoparticles: Imaging, Spectroscopic, and Separation Techniques. Crit. Rev. Solid State Mat. Sci. 2014, 39 (6), 423-458. URL

This article is an overview of the different techniques used to identify, characterize, and quantify engineered nanoparticles (ENPs). The state-of-the-art of the field has been summarized, and the different characterization techniques have been grouped according to the information they can provide. Some selected applications have been highlighted for each technique. The classification of the techniques has been carried out according to the main physical and chemical properties of the nanoparticles such as morphology, size, polydispersity characteristics, structural information, and elemental composition. Microscopy techniques including optical, electron and X-ray microscopy, and separation techniques with and without hyphenated detection systems have been discussed. For each of these groups, a brief description of the techniques, specific features, and concepts, as well as several examples, have been described.

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